12th Asian Test Symposium (ATS'03) Test Response Compression Based on Huffman Coding Xi?an, China November 16-November 19 ISBN: 0-7695-1951-2
Test compression/decompression is an efficient method for reducing the test application cost. In this paper we propose a response compression method based on Huffman coding. The proposed method guarantees zero-aliasing because faulty responses are mapped into code words, not just fault-free ones. Moreover the method is independent of the fault model and the structure of a circuit-under-test, and uses only the knowledge of the fault-free responses corresponding to a given test input set. Experimental results of the compression ratio and the size of the encoder for the proposed method are presented.
Citation:
Hideyuki Ichihara, Michihiro Shintani, Toshihiro Ohara, Tomoo Inoue, "Test Response Compression Based on Huffman Coding," ats, pp.446, 12th Asian Test Symposium (ATS'03), 2003 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||