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11th Asian Test Symposium (ATS'02)
Effects of Amplitude Modulation in Jitter Tolerance Measurements of Communication Devices
Guam, USA
November 18-November 20
ISBN: 0-7695-1825-7
ASCII Text
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Masahiro Ishida, Takahiro J. Yamaguchi, Mana Sona, Hirobumi Musha, "Effects of Amplitude Modulation in Jitter Tolerance Measurements of Communication Devices," Asian Test Symposium, pp. 45, 11th Asian Test Symposium (ATS'02), 2002.
 
 
BibTex
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@article{ 10.1109/ATS.2002.1181683,
author = {Masahiro Ishida and Takahiro J. Yamaguchi and Mana Sona and Hirobumi Musha},
title = {Effects of Amplitude Modulation in Jitter Tolerance Measurements of Communication Devices},
journal ={Asian Test Symposium},
volume = {0},
year = {2002},
issn = {1081-7735},
pages = {45},
doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.2002.1181683},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - Asian Test Symposium
TI - Effects of Amplitude Modulation in Jitter Tolerance Measurements of Communication Devices
SN - 1081-7735
SP
EP
A1 - Masahiro Ishida,
A1 - Takahiro J. Yamaguchi,
A1 - Mana Sona,
A1 - Hirobumi Musha,
PY - 2002
KW - null
VL - 0
JA - Asian Test Symposium
ER -
 
Masahiro Ishida, Advantest Laboratories, Ltd.
Takahiro J. Yamaguchi, Advantest Laboratories, Ltd.
Mana Sona, University of Washington
Hirobumi Musha, Advantest Corporation
This paper presents an experimental study of random jitter modulation in a commercial serializer-deserializer device to demonstrate the effects of possible amplitude modulation in jitter tolerance measurements. The paper recommends alternative methods for injecting random jitter to avoid this source of measurement error.
Citation:
Masahiro Ishida, Takahiro J. Yamaguchi, Mana Sona, Hirobumi Musha, "Effects of Amplitude Modulation in Jitter Tolerance Measurements of Communication Devices," ats, pp.45, 11th Asian Test Symposium (ATS'02), 2002
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