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11th Asian Test Symposium (ATS'02)
Test Limitations of Parametric Faults in Analog Circuits
Guam, USA
November 18-November 20
ISBN: 0-7695-1825-7
ASCII Text
x 
 
Jacob Savir, Zhen Guo, "Test Limitations of Parametric Faults in Analog Circuits," Asian Test Symposium, pp. 39, 11th Asian Test Symposium (ATS'02), 2002.
 
 
BibTex
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@article{ 10.1109/ATS.2002.1181682,
author = {Jacob Savir and Zhen Guo},
title = {Test Limitations of Parametric Faults in Analog Circuits},
journal ={Asian Test Symposium},
volume = {0},
year = {2002},
issn = {1081-7735},
pages = {39},
doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.2002.1181682},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Asian Test Symposium
TI - Test Limitations of Parametric Faults in Analog Circuits
SN - 1081-7735
SP
EP
A1 - Jacob Savir,
A1 - Zhen Guo,
PY - 2002
KW - null
VL - 0
JA - Asian Test Symposium
ER -
 
Jacob Savir, New Jersey Institute of Technology
Zhen Guo, New Jersey Institute of Technology
This paper investigates the detectability of parameter faults in linear, time-invariant, analog circuits. We show that there are inherent limitations with regard to analog faults detectability.
Citation:
Jacob Savir, Zhen Guo, "Test Limitations of Parametric Faults in Analog Circuits," ats, pp.39, 11th Asian Test Symposium (ATS'02), 2002
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