Ninth Asian Test Symposium (ATS'00) Distribution-graph based approach and extended tree growing technique in power-constrained block-test scheduling Taipei, Taiwan December 04-December 06 ISBN: 0-7695-0887-1
A distribution-graph based scheduling algorithm is proposed together with an extended tree growing technique to deal with the problem of unequal-length block-test scheduling under power dissipation constraints. The extended tree growing technique is used in combination with the classical scheduling approach in order to improve the test concurrency having assigned power dissipation limits. Its goal is to achieve a balanced test power dissipation by employing a least mean square error function. The least mean square error function is a distribution-graph based global priority function. Test scheduling examples and experiments highlight in the end the efficiency of this approach towards a system-level test scheduling algorithm.
Index Terms:
trees (mathematics); scheduling; least mean squares methods; VLSI; integrated circuit testing; automatic test pattern generation; high level synthesis; fault diagnosis; logic testing; distribution-graph based approach; extended tree growing technique; power-constrained block-test scheduling; unequal-length block-test scheduling; power dissipation constraints; test concurrency; assigned power dissipation limits; balanced test power dissipation; least mean square error function; global priority function; system-level test scheduling algorithm
Citation:
V. Murescan, Xiaojun Wang, M. Vladutiu, "Distribution-graph based approach and extended tree growing technique in power-constrained block-test scheduling," ats, pp.465, Ninth Asian Test Symposium (ATS'00), 2000 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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