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Ninth Asian Test Symposium (ATS'00)
TI-BIST: a temperature independent analog BIST for switched-capacitor filters
Taipei, Taiwan
December 04-December 06
ISBN: 0-7695-0887-1
ASCII Text
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L. Carro, E. Cota, M. Lubaszewski, Y. Bertrand, F. Azais, M. Renovell, "TI-BIST: a temperature independent analog BIST for switched-capacitor filters," Asian Test Symposium, pp. 78, Ninth Asian Test Symposium (ATS'00), 2000.
 
 
BibTex
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@article{ 10.1109/ATS.2000.893606,
author = {L. Carro and E. Cota and M. Lubaszewski and Y. Bertrand and F. Azais and M. Renovell},
title = {TI-BIST: a temperature independent analog BIST for switched-capacitor filters},
journal ={Asian Test Symposium},
volume = {0},
year = {2000},
issn = {1081-7735},
pages = {78},
doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.2000.893606},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Asian Test Symposium
TI - TI-BIST: a temperature independent analog BIST for switched-capacitor filters
SN - 1081-7735
SP
EP
A1 - L. Carro,
A1 - E. Cota,
A1 - M. Lubaszewski,
A1 - Y. Bertrand,
A1 - F. Azais,
A1 - M. Renovell,
PY - 2000
KW - built-in self test; analogue circuits; switched capacitor filters; temperature independent analog BIST; switched-capacitor filters; BIST; analog BIST; simulation
VL - 0
JA - Asian Test Symposium
ER -
 
L. Carro, Dept. de Engenharia Eletrika, Univ. Federal do Rio Grande do Sul, Porto Alegre, Brazil
E. Cota, Dept. de Engenharia Eletrika, Univ. Federal do Rio Grande do Sul, Porto Alegre, Brazil
M. Lubaszewski, Dept. de Engenharia Eletrika, Univ. Federal do Rio Grande do Sul, Porto Alegre, Brazil
Y. Bertrand, Dept. de Engenharia Eletrika, Univ. Federal do Rio Grande do Sul, Porto Alegre, Brazil
F. Azais, Dept. de Engenharia Eletrika, Univ. Federal do Rio Grande do Sul, Porto Alegre, Brazil
M. Renovell, Dept. de Engenharia Eletrika, Univ. Federal do Rio Grande do Sul, Porto Alegre, Brazil
This paper describes a method to obtain a temperature independent analog BIST. The test procedure is based on the reuse of existing analog circuits, configured either as stimuli generators or as signature analyzers. The paper explains the general problem of temperature deviation present in analog BIST, and shows an approach to overcome this limitation, validated by simulation results.
Index Terms:
built-in self test; analogue circuits; switched capacitor filters; temperature independent analog BIST; switched-capacitor filters; BIST; analog BIST; simulation
Citation:
L. Carro, E. Cota, M. Lubaszewski, Y. Bertrand, F. Azais, M. Renovell, "TI-BIST: a temperature independent analog BIST for switched-capacitor filters," ats, pp.78, Ninth Asian Test Symposium (ATS'00), 2000
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