Optimal test-set generation for parametric fault detection in switched capacitor filters

A
ATS
2000
Ninth Asian Test Symposium (ATS'00)
Abstract - Optimal test-set generation for parametric fault detection in switched capacitor filters

	This Article
	Subscribers, please Login Purchase article: $19 PDF IEEE Xplore Subscribers RSS feed
	Share
	Email this Article to a friend
	Bibliographic References
	ASCII Text BibTex RefWorks Procite/RefMan
	Add to:
	Digg Furl Spurl Blink Simpy Google Del.icio.us Y!MyWeb
	Search
	Similar Articles Articles by Wooyoung Choi Articles by R. Harjani Articles by B. Vinnakota

Ninth Asian Test Symposium (ATS'00)

Taipei, Taiwan

December 04-December 06

ISBN: 0-7695-0887-1

	ASCII Text	x
	Wooyoung Choi, R. Harjani, B. Vinnakota, "Optimal test-set generation for parametric fault detection in switched capacitor filters," Asian Test Symposium, pp. 72, Ninth Asian Test Symposium (ATS'00), 2000.

	BibTex	x
	@article{ 10.1109/ATS.2000.893605, author = {Wooyoung Choi and R. Harjani and B. Vinnakota}, title = {Optimal test-set generation for parametric fault detection in switched capacitor filters}, journal ={Asian Test Symposium}, volume = {0}, year = {2000}, issn = {1081-7735}, pages = {72}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.2000.893605}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Asian Test Symposium TI - Optimal test-set generation for parametric fault detection in switched capacitor filters SN - 1081-7735 SP EP A1 - Wooyoung Choi, A1 - R. Harjani, A1 - B. Vinnakota, PY - 2000 KW - switched capacitor filters; fault location; circuit testing; test-set generation; parametric fault detection; switched capacitor filters; capacitor ratios; switched capacitor circuits; fault detection VL - 0 JA - Asian Test Symposium ER -

Wooyoung Choi, Minnesota Univ., Minneapolis, MN, USA

R. Harjani, Minnesota Univ., Minneapolis, MN, USA

B. Vinnakota, Minnesota Univ., Minneapolis, MN, USA

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ATS.2000.893605

The functional performance of switched capacitor circuits is directly affected by variations in capacitor ratios. We have proposed techniques to accurately measure these capacitor ratios. In this paper we develop an optimal procedure to minimize the number of capacitor ratios that need to be measured while still maintaining the desired fault coverage. We make use of the sensitivity of individual performance specifications to specific capacitor ratios. The procedure has been validated with a number of examples including a first order lossy integrator a second order low-pass filter and sixth order high Q bandpass filter. The procedure developed in this paper can easily be extended to include other switched capacitor circuits.

Index Terms:

switched capacitor filters; fault location; circuit testing; test-set generation; parametric fault detection; switched capacitor filters; capacitor ratios; switched capacitor circuits; fault detection

Citation:

Wooyoung Choi, R. Harjani, B. Vinnakota, "Optimal test-set generation for parametric fault detection in switched capacitor filters," ats, pp.72, Ninth Asian Test Symposium (ATS'00), 2000

Peer Review Notice | Give Us Feedback

Usage of this product signifies your acceptance of the Terms of Use.