Optimized Statistical Analog Fault Simulation

A
ATS
1999
Eighth Asian Test Symposium (ATS'99)
Abstract - Optimized Statistical Analog Fault Simulation

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Eighth Asian Test Symposium (ATS'99)

Shanghai, China

November 16-November 18

ISBN: 0-7695-0315-2

	ASCII Text	x
	Abdelhakim Khouas, Mohamed Dessouky, Anne Derieux, "Optimized Statistical Analog Fault Simulation," Asian Test Symposium, pp. 227, Eighth Asian Test Symposium (ATS'99), 1999.

	BibTex	x
	@article{ 10.1109/ATS.1999.810755, author = {Abdelhakim Khouas and Mohamed Dessouky and Anne Derieux}, title = {Optimized Statistical Analog Fault Simulation}, journal ={Asian Test Symposium}, volume = {0}, year = {1999}, issn = {1081-7735}, pages = {227}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.1999.810755}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Asian Test Symposium TI - Optimized Statistical Analog Fault Simulation SN - 1081-7735 SP EP A1 - Abdelhakim Khouas, A1 - Mohamed Dessouky, A1 - Anne Derieux, PY - 1999 KW - Analog Testing KW - Fault Simulation KW - Statistical Simulation VL - 0 JA - Asian Test Symposium ER -

Abdelhakim Khouas, University of Pierre et Marie Curie

Mohamed Dessouky, University of Pierre et Marie Curie

Anne Derieux, University of Pierre et Marie Curie

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ATS.1999.810755

A new statistical method for analog fault simulation is presented. The method takes into account process parameter variations and aims to reduce the number of the computational expensive Monte Carlo simulations often required during analog fault simulation. The technique is illustrated by means of a fifth-order low-pass switched-capacitor filter.

Index Terms:

Analog Testing, Fault Simulation, Statistical Simulation

Citation:

Abdelhakim Khouas, Mohamed Dessouky, Anne Derieux, "Optimized Statistical Analog Fault Simulation," ats, pp.227, Eighth Asian Test Symposium (ATS'99), 1999

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