In this paper, we focus on how IDDQ current value varies depending on the test vectors and the resistance of bridging faults. Detection of a large IDDQ is easier than a small IDDQ, because the value of IDDQ is normally of the order of microamperes. If suitable logic values are assigned to the faulty nodes, a small channel resistance will be obtained and then a large IDDQ will flow. We have performed the simulation to show that the value of IDDQ depends on the test vectors that applied to the faulty nodes for external and internal bridging nodes. As a result, IDDQ at low resistance bridging fault increased by 26%-36% for external bridging fault between different gates. For internal bridging fault between any gates, the increased IDDQ is 27%-159% for all resistive bridging faults.