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Eighth Asian Test Symposium (ATS'99)
An Evaluation of Test Generation Algorithms for combinational Circuits
Shanghai, China
November 16-November 18
ISBN: 0-7695-0315-2
ASCII Text
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Shiyi Xu, Tukwasibwe Justaf Frank, "An Evaluation of Test Generation Algorithms for combinational Circuits," Asian Test Symposium, pp. 63, Eighth Asian Test Symposium (ATS'99), 1999.
 
 
BibTex
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@article{ 10.1109/ATS.1999.810730,
author = {Shiyi Xu and Tukwasibwe Justaf Frank},
title = {An Evaluation of Test Generation Algorithms for combinational Circuits},
journal ={Asian Test Symposium},
volume = {0},
year = {1999},
issn = {1081-7735},
pages = {63},
doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.1999.810730},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Asian Test Symposium
TI - An Evaluation of Test Generation Algorithms for combinational Circuits
SN - 1081-7735
SP
EP
A1 - Shiyi Xu,
A1 - Tukwasibwe Justaf Frank,
PY - 1999
KW - Testability
KW - Genetic Algorithm
KW - Forecasting
KW - Test Generation
VL - 0
JA - Asian Test Symposium
ER -
 
Shiyi Xu, Shanghai University
Tukwasibwe Justaf Frank, Shanghai University
Within this era of VLSI circuits, testability is truly a very crucial issue. To generate a test set for a given circuit, choice of an algorithm within a number of existing test generation algorithms to apply is bound to vary from circuit to circuit. Some objective quantitative measures are used in making such choice. Such measures are so important to the analysis of algorithms that become the subject of this work.
Index Terms:
Testability, Genetic Algorithm, Forecasting, Test Generation
Citation:
Shiyi Xu, Tukwasibwe Justaf Frank, "An Evaluation of Test Generation Algorithms for combinational Circuits," ats, pp.63, Eighth Asian Test Symposium (ATS'99), 1999
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