Satoshi Ohtake, Toshimitsu Masuzawa, Hideo Fujiwara, "A Non-Scan DFT Method for Controllers to Achieve Complete Fault Efficiency," Asian Test Symposium, pp. 204, Seventh Asian Test Symposium (ATS'98), 1998.

@article{ 10.1109/ATS.1998.741615,
author = {Satoshi Ohtake and Toshimitsu Masuzawa and Hideo Fujiwara},
title = {A Non-Scan DFT Method for Controllers to Achieve Complete Fault Efficiency},
journal ={Asian Test Symposium},
volume = {0},
year = {1998},
issn = {1081-7735},
pages = {204},
doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.1998.741615},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}

TY - CONF
JO - Asian Test Symposium
TI - A Non-Scan DFT Method for Controllers to Achieve Complete Fault Efficiency
SN - 1081-7735
SP
EP
A1 - Satoshi Ohtake,
A1 - Toshimitsu Masuzawa,
A1 - Hideo Fujiwara,
PY - 1998
VL - 0
JA - Asian Test Symposium
ER -