Non-Intrusive Testing of High-Speed CML Circuits

	This Article
	Subscribers, please Login Purchase article: $19 PDF IEEE Xplore Subscribers RSS feed
	Share
	Email this Article to a friend
	Bibliographic References
	ASCII Text BibTex RefWorks Procite/RefMan
	Add to:
	Digg Furl Spurl Blink Simpy Google Del.icio.us Y!MyWeb
	Search
	Similar Articles Articles by V. Devdas Articles by A. Ivanov

Seventh Asian Test Symposium (ATS'98)

Singapore

December 02-December 04

ISBN: 0-8186-8277-9

	ASCII Text	x
	V. Devdas, A. Ivanov, "Non-Intrusive Testing of High-Speed CML Circuits," Asian Test Symposium, pp. 172, Seventh Asian Test Symposium (ATS'98), 1998.

	BibTex	x
	@article{ 10.1109/ATS.1998.741610, author = {V. Devdas and A. Ivanov}, title = {Non-Intrusive Testing of High-Speed CML Circuits}, journal ={Asian Test Symposium}, volume = {0}, year = {1998}, issn = {1081-7735}, pages = {172}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.1998.741610}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Asian Test Symposium TI - Non-Intrusive Testing of High-Speed CML Circuits SN - 1081-7735 SP EP A1 - V. Devdas, A1 - A. Ivanov, PY - 1998 VL - 0 JA - Asian Test Symposium ER -

Citation:

V. Devdas, A. Ivanov, "Non-Intrusive Testing of High-Speed CML Circuits," ats, pp.172, Seventh Asian Test Symposium (ATS'98), 1998

Usage of this product signifies your acceptance of the Terms of Use.