Y.-C. Hsu, S.K. Gupta, "An Automatic Test Pattern Generator for At-Speed Robust Path Delay Testing," Asian Test Symposium, pp. 88, Seventh Asian Test Symposium (ATS'98), 1998.

@article{ 10.1109/ATS.1998.741595,
author = {Y.-C. Hsu and S.K. Gupta},
title = {An Automatic Test Pattern Generator for At-Speed Robust Path Delay Testing},
journal ={Asian Test Symposium},
volume = {0},
year = {1998},
issn = {1081-7735},
pages = {88},
doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.1998.741595},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}

TY - CONF
JO - Asian Test Symposium
TI - An Automatic Test Pattern Generator for At-Speed Robust Path Delay Testing
SN - 1081-7735
SP
EP
A1 - Y.-C. Hsu,
A1 - S.K. Gupta,
PY - 1998
VL - 0
JA - Asian Test Symposium
ER -