F. Vargas, E. Bezerra, L. Wulff, D. Barros, Jr., "Optimizing HW/SW Codesign towards Reliability for Critical-Application Systems," Asian Test Symposium, pp. 52, Seventh Asian Test Symposium (ATS'98), 1998.

@article{ 10.1109/ATS.1998.741584,
author = {F. Vargas and E. Bezerra and L. Wulff and D. Barros, Jr.},
title = {Optimizing HW/SW Codesign towards Reliability for Critical-Application Systems},
journal ={Asian Test Symposium},
volume = {0},
year = {1998},
issn = {1081-7735},
pages = {52},
doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.1998.741584},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}

TY - CONF
JO - Asian Test Symposium
TI - Optimizing HW/SW Codesign towards Reliability for Critical-Application Systems
SN - 1081-7735
SP
EP
A1 - F. Vargas,
A1 - E. Bezerra,
A1 - L. Wulff,
A1 - D. Barros, Jr.,
PY - 1998
VL - 0
JA - Asian Test Symposium
ER -