BIST Diagnostics, Part 1: Simulation Models

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Seventh Asian Test Symposium (ATS'98)

Singapore

December 02-December 04

ISBN: 0-8186-8277-9

	ASCII Text	x
	J. Savir, "BIST Diagnostics, Part 1: Simulation Models," Asian Test Symposium, pp. 8, Seventh Asian Test Symposium (ATS'98), 1998.

	BibTex	x
	@article{ 10.1109/ATS.1998.741569, author = {J. Savir}, title = {BIST Diagnostics, Part 1: Simulation Models}, journal ={Asian Test Symposium}, volume = {0}, year = {1998}, issn = {1081-7735}, pages = {8}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.1998.741569}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Asian Test Symposium TI - BIST Diagnostics, Part 1: Simulation Models SN - 1081-7735 SP EP A1 - J. Savir, PY - 1998 VL - 0 JA - Asian Test Symposium ER -

Citation:

J. Savir, "BIST Diagnostics, Part 1: Simulation Models," ats, pp.8, Seventh Asian Test Symposium (ATS'98), 1998

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