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Sixth Asian Test Symposium (ATS'97)
An Algorithmic Test Generation Method for Crosstalk Faults in Synchronous Sequential Circuits
Akita, JAPAN
November 17-November 18
ISBN: 0-8186-8209-4
ASCII Text
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Noroyoshi Itazaki, Yasutaka Idomoto, Kozo Kinoshita, "An Algorithmic Test Generation Method for Crosstalk Faults in Synchronous Sequential Circuits," Asian Test Symposium, pp. 22, Sixth Asian Test Symposium (ATS'97), 1997.
 
 
BibTex
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@article{ 10.1109/ATS.1997.643909,
author = {Noroyoshi Itazaki and Yasutaka Idomoto and Kozo Kinoshita},
title = {An Algorithmic Test Generation Method for Crosstalk Faults in Synchronous Sequential Circuits},
journal ={Asian Test Symposium},
volume = {0},
year = {1997},
issn = {1081-7735},
pages = {22},
doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.1997.643909},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Asian Test Symposium
TI - An Algorithmic Test Generation Method for Crosstalk Faults in Synchronous Sequential Circuits
SN - 1081-7735
SP
EP
A1 - Noroyoshi Itazaki,
A1 - Yasutaka Idomoto,
A1 - Kozo Kinoshita,
PY - 1997
KW - Crosstalk fault
KW - test generation
KW - synchronous sequential circuit
VL - 0
JA - Asian Test Symposium
ER -
 
Noroyoshi Itazaki, Applied Physics, Osaka Univ.
Yasutaka Idomoto, Applied Physics, Osaka Univ.
Kozo Kinoshita, Applied Physics, Osaka Univ.
As VLSI circuits become high-speed and high-density, a crosstalk fault becomes an important problem. In a synchronous sequential circuit, since the crosstalk fault between a data line and a clock line is important, we described an algorithmic test generation technique for the fault. Some simulation results of our method for the ISCAS bench mark circuits are reported.
Index Terms:
Crosstalk fault, test generation, synchronous sequential circuit
Citation:
Noroyoshi Itazaki, Yasutaka Idomoto, Kozo Kinoshita, "An Algorithmic Test Generation Method for Crosstalk Faults in Synchronous Sequential Circuits," ats, pp.22, Sixth Asian Test Symposium (ATS'97), 1997
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