Fifth Asian Test Symposium (ATS'96) Hierarchical Testing Using the IEEE Std 1149.5 Module Test and Maintenance Slave Interface Module Hsinchu, TAIWAN November 20-November 22 ISBN: 0-8186-7478-4
An IEEE Std 1149.5 MTM-Bus Slave interface module is presented, which is used for direct access to 1149.1 chip-level buses and hierarchical test. All the standard 1149.1 functions, such as SAMPLE/PRELOAD, EXTEST, BYPASS, and even RUNBIST, can be performed within three 1149.5 Read/Write-Data message cycles. The messages are transmitted between the MTM-bus Master module (M-module) and the Slave module (S-module). We adopt the Full TAP Control (FTC) method to activate the 1149.1 Boundary-Scan paths via the 1149.5 MTM-Bus. A personal computer is used as the M-module.
Index Terms:
MTM Bus, Boundary Scan, Hierarchical Testing
Citation:
Jin-Hua Hong, Chung-Hung Tsai, Cheng-Wen Wu, "Hierarchical Testing Using the IEEE Std 1149.5 Module Test and Maintenance Slave Interface Module," ats, pp.50, Fifth Asian Test Symposium (ATS'96), 1996 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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