Y-M. Hur, J-H. Shin, K-H. Lee, Y-S. Son, I-C. Lim, Y-H. Kim, "Efficient Path Delay Fault Test Generation Algorithms for Weighted Random Robust Testing," Asian Test Symposium, pp. 42, Fifth Asian Test Symposium (ATS'96), 1996.

@article{ 10.1109/ATS.1996.10002,
author = {Y-M. Hur and J-H. Shin and K-H. Lee and Y-S. Son and I-C. Lim and Y-H. Kim},
title = {Efficient Path Delay Fault Test Generation Algorithms for Weighted Random Robust Testing},
journal ={Asian Test Symposium},
volume = {0},
year = {1996},
issn = {1081-7735},
pages = {42},
doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.1996.10002},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}

TY - CONF
JO - Asian Test Symposium
TI - Efficient Path Delay Fault Test Generation Algorithms for Weighted Random Robust Testing
SN - 1081-7735
SP
EP
A1 - Y-M. Hur,
A1 - J-H. Shin,
A1 - K-H. Lee,
A1 - Y-S. Son,
A1 - I-C. Lim,
A1 - Y-H. Kim,
PY - 1996
VL - 0
JA - Asian Test Symposium
ER -