Testability analysis of co-designed systems

A
ATS
1995
Fourth Asian Test Symposium (ATS'95)
Abstract - Testability analysis of co-designed systems

	This Article
	Subscribers, please Login Purchase article: $19 PDF IEEE Xplore Subscribers RSS feed
	Share
	Email this Article to a friend
	Bibliographic References
	ASCII Text BibTex RefWorks Procite/RefMan
	Add to:
	Digg Furl Spurl Blink Simpy Google Del.icio.us Y!MyWeb
	Search
	Similar Articles Articles by Y. Le Traon Articles by C. Robach

Fourth Asian Test Symposium (ATS'95)

Bangalore, India

November 23-November 24

ISBN: 0-8186-7129-7

	ASCII Text	x
	Y. Le Traon, C. Robach, "Testability analysis of co-designed systems," Asian Test Symposium, pp. 206, Fourth Asian Test Symposium (ATS'95), 1995.

	BibTex	x
	@article{ 10.1109/ATS.1995.485338, author = {Y. Le Traon and C. Robach}, title = {Testability analysis of co-designed systems}, journal ={Asian Test Symposium}, volume = {0}, year = {1995}, isbn = {0-8186-7129-7}, pages = {206}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.1995.485338}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Asian Test Symposium TI - Testability analysis of co-designed systems SN - 0-8186-7129-7 SP EP A1 - Y. Le Traon, A1 - C. Robach, PY - 1995 KW - program testing; data flow analysis; data flow graphs; automatic test software; hardware description languages; computer aided software engineering; formal specification; co-designed data-flow specifications; testability analysis; high level testability analysis; test set generation; fault diagnosis; hardware modelling; information transfer graph; avionics systems; bipartite directed graph; functional specification; SATAN tool; computer assisted specification diagram; all-nodes criterion; all-paths criterion; multiple clue strategy; start big strategy; diagnosis quality factor; software components testability VL - 0 JA - Asian Test Symposium ER -

Y. Le Traon, LGI-IMAG, Grenoble, France

C. Robach, LGI-IMAG, Grenoble, France

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ATS.1995.485338

This paper focus on the testability analysis of co-designed data-flow specifications. The co-designed specification level implies a high level testability analysis, independent of the implementation choices. With respect to testability, the difficulties of generating test sets, detecting and diagnosing faults are discussed and estimates are proposed. A hardware modelling, based on information transfers and called the Information Transfer Graph, is adapted to the specifications. A real case study supplied by Aerospatiale illustrates all the evaluations.

Index Terms:

program testing; data flow analysis; data flow graphs; automatic test software; hardware description languages; computer aided software engineering; formal specification; co-designed data-flow specifications; testability analysis; high level testability analysis; test set generation; fault diagnosis; hardware modelling; information transfer graph; avionics systems; bipartite directed graph; functional specification; SATAN tool; computer assisted specification diagram; all-nodes criterion; all-paths criterion; multiple clue strategy; start big strategy; diagnosis quality factor; software components testability

Citation:

Y. Le Traon, C. Robach, "Testability analysis of co-designed systems," ats, pp.206, Fourth Asian Test Symposium (ATS'95), 1995

Peer Review Notice | Give Us Feedback

Usage of this product signifies your acceptance of the Terms of Use.