A new method for testing mixed analog and digital circuits

A
ATS
1995
Fourth Asian Test Symposium (ATS'95)
Abstract - A new method for testing mixed analog and digital circuits

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Fourth Asian Test Symposium (ATS'95)

Bangalore, India

November 23-November 24

ISBN: 0-8186-7129-7

	ASCII Text	x
	J. Rzeszut, B. Kaminska, Y. Savaria, "A new method for testing mixed analog and digital circuits," Asian Test Symposium, pp. 127, Fourth Asian Test Symposium (ATS'95), 1995.

	BibTex	x
	@article{ 10.1109/ATS.1995.485327, author = {J. Rzeszut and B. Kaminska and Y. Savaria}, title = {A new method for testing mixed analog and digital circuits}, journal ={Asian Test Symposium}, volume = {0}, year = {1995}, isbn = {0-8186-7129-7}, pages = {127}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.1995.485327}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Asian Test Symposium TI - A new method for testing mixed analog and digital circuits SN - 0-8186-7129-7 SP EP A1 - J. Rzeszut, A1 - B. Kaminska, A1 - Y. Savaria, PY - 1995 KW - mixed analogue-digital integrated circuits; integrated circuit testing; shift registers; analogue processing circuits; charge-coupled device circuits; mixed analog and digital circuits; analog test points; simultaneous observation; analog multiplexer; signal path; charge coupled device; analog shift register; input voltage VL - 0 JA - Asian Test Symposium ER -

J. Rzeszut, Ecole Polytech. de Montreal, Que., Canada

B. Kaminska, Ecole Polytech. de Montreal, Que., Canada

Y. Savaria, Ecole Polytech. de Montreal, Que., Canada

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ATS.1995.485327

In this paper a new method is proposed for observing analog test points inside integrated circuits that enables the simultaneous observation of a large number of points. The method permits the removal of the analog multiplexer from the signal path and a reduction of the load introduced at the observed test points. A charge coupled device analog shift register is used to sample input voltage and shift out a charge that is proportional to the input voltage.

Index Terms:

mixed analogue-digital integrated circuits; integrated circuit testing; shift registers; analogue processing circuits; charge-coupled device circuits; mixed analog and digital circuits; analog test points; simultaneous observation; analog multiplexer; signal path; charge coupled device; analog shift register; input voltage

Citation:

J. Rzeszut, B. Kaminska, Y. Savaria, "A new method for testing mixed analog and digital circuits," ats, pp.127, Fourth Asian Test Symposium (ATS'95), 1995

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