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12th IEEE International Symposium on Asynchronous Circuits and Systems (ASYNC'06)
Low-Overhead Testing of Delay Faults in High-Speed Asynchronous Pipelines
Grenoble, France
March 13-March 15
ISBN: 0-7695-2498-2
Gennette Gill, UNC Chapel Hill
Ankur Agiwal, UNC Chapel Hill
Montek Singh, UNC Chapel Hill
Feng Shi, Yale University
Yiorgos Makris, Yale University
We propose a low-overhead method for delay fault testing in high-speed asynchronous pipelines. The key features of our work are: (i) testing strategies can be administered using low-speed testing equipment; (ii) testing is minimallyintrusive, i.e. very little testing hardware needs to be added; (iii) testing methods are extended to pipelines with forks and joins, which is an important first step to testing pipelines with arbitrary topologies; (iv) test pattern generation takes into account the likely event that one delay fault causes several bits of data to become corrupted; and (v) test generation can leverage existing stuck-at ATPG tools. In describing our testing strategy, we use examples of faults from three very different high-speed pipeline styles: MOUSETRAP, GasP, and high-capacity (HC) pipelines. In addition, we give an in-depth example"including test pattern generation" for both linear and non-linear MOUSETRAP pipelines.
Citation:
Gennette Gill, Ankur Agiwal, Montek Singh, Feng Shi, Yiorgos Makris, "Low-Overhead Testing of Delay Faults in High-Speed Asynchronous Pipelines," async, pp.46-56, 12th IEEE International Symposium on Asynchronous Circuits and Systems (ASYNC'06), 2006
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