SEU-Tolerant QDI Circuits

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11th IEEE International Symposium on Asynchronous Circuits and Systems (ASYNC'05)

New York City, New York, USA

March 14-March 16

ISBN: 0-7695-2305-6

	ASCII Text	x
	Wonjin Jang, Alain Martin, "SEU-Tolerant QDI Circuits," Asynchronous Circuits and Systems, International Symposium on, pp. 156-165, 11th IEEE International Symposium on Asynchronous Circuits and Systems (ASYNC'05), 2005.

	BibTex	x
	@article{ 10.1109/ASYNC.2005.30, author = {Wonjin Jang and Alain Martin}, title = {SEU-Tolerant QDI Circuits}, journal ={Asynchronous Circuits and Systems, International Symposium on}, volume = {0}, year = {2005}, issn = {1522-8681}, pages = {156-165}, doi = {http://doi.ieeecomputersociety.org/10.1109/ASYNC.2005.30}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Asynchronous Circuits and Systems, International Symposium on TI - SEU-Tolerant QDI Circuits SN - 1522-8681 SP156 EP165 A1 - Wonjin Jang, A1 - Alain Martin, PY - 2005 KW - null VL - 0 JA - Asynchronous Circuits and Systems, International Symposium on ER -

Wonjin Jang, California Institute of Technology

Alain Martin, California Institute of Technology

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ASYNC.2005.30

This paper addresses the issue of Single-Event Upset (SEU) in quasi delay-insensitive (QDI) asynchronous circuits. We show that an SEU can cause abnormal computations in QDI circuits beside deadlock, and we propose a generalmethod to make QDI circuits SEU-tolerant. We present a simplified SEU-tolerant buffer implementations for CMOS technology. Finally, we present a case study of a one-bit comparator and show SPICE-simulation results.

Citation:

Wonjin Jang, Alain Martin, "SEU-Tolerant QDI Circuits," async, pp.156-165, 11th IEEE International Symposium on Asynchronous Circuits and Systems (ASYNC'05), 2005

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