2007 Asia and South Pacific Design Automation Conference Cyclic-CPRS : A Diagnosis Technique for BISTed Circuits for Nano-meter Technologies Yokohama January 23-January 26 ISBN: 1-4244-0629-3
A cyclic-CPRS (column parity row selection) technique is presented to diagnose built-in self tested (BISTed) circuits, even in the presence of many unknowns and transient errors. The novel cyclic scan chains retain the transient errors and unknowns in the CUT until they are fully diagnosed. Instead of masking the unknowns, Cyclic-CPRS directly diagnoses the unknowns as if they were errors. Direct diagnosis of unknowns not only eliminates the masking circuitry but also enhances the diagnosis resolution. Experimental results show that Cyclic-CPRS is very successful even in the presence of 10% errors and unknowns. The proposed technique is especially suitable for nanometer technologies, in which transient errors and systematic defects are becoming serious problems.
Index Terms:
systematic defects, nanometer technologies, cyclic-column parity row selection technique, built-in self tested circuits, transient errors, cyclic scan chains, circuit under test, masking circuitry
Citation:
null Chun-Yi Lee, null Hung-Mao Lin, null Fang-Min Wang, null James Chien-Mo Li, "Cyclic-CPRS : A Diagnosis Technique for BISTed Circuits for Nano-meter Technologies," asp-dac, pp.835-840, 2007 Asia and South Pacific Design Automation Conference, 2007 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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