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16th IEEE International Conference on Automated Software Engineering (ASE'01)
Generation of Functional Test Sequences from B Formal Specifications-Presentation and Industrial Case Study
San Diego, California
November 26-November 29
ISBN: 0-7695-1426-X
Bruno Legeard, Laboratoire d?Informatique de l?Universit? de Franche-Comt?
Fabien Peureux, Laboratoire d?Informatique de l?Universit? de Franche-Comt?
This paper presents an original method to generate test sequences. From formal specifications of the system to be tested, an equivalent system of constraints is derived, and then, the domain of each state variable of this system is partitioned into subdomains. Using this partition, limit states are computed with a specific solver that uses Constraint Logic Programming with sets. This specific solver is then used to build test sequences by traversing the constrained reachability graph of the specifications. Finally, the formal specifications is used as an oracle by using them to determine the expected output for a given input. The results of an industrial case-study of the Smart Card GSM 11-11 standard are presented and discussed.
Index Terms:
specification-based testing, B notation, Constraint Logic Programming, GSM 11-11 standard
Citation:
Bruno Legeard, Fabien Peureux, "Generation of Functional Test Sequences from B Formal Specifications-Presentation and Industrial Case Study," ase, pp.377, 16th IEEE International Conference on Automated Software Engineering (ASE'01), 2001
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