H. Yoon, B. Choi, J.-O. Jeon, "Mutation-Based Inter-Class Testing," Asia-Pacific Software Engineering Conference, pp. 174, Fifth Asia-Pacific Software Engineering Conference (APSEC'98), 1998.

@article{ 10.1109/APSEC.1998.733717,
author = {H. Yoon and B. Choi and J.-O. Jeon},
title = {Mutation-Based Inter-Class Testing},
journal ={Asia-Pacific Software Engineering Conference},
volume = {0},
year = {1998},
isbn = {0-8186-9183-2},
pages = {174},
doi = {http://doi.ieeecomputersociety.org/10.1109/APSEC.1998.733717},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}

TY - CONF
JO - Asia-Pacific Software Engineering Conference
TI - Mutation-Based Inter-Class Testing
SN - 0-8186-9183-2
SP
EP
A1 - H. Yoon,
A1 - B. Choi,
A1 - J.-O. Jeon,
PY - 1998
VL - 0
JA - Asia-Pacific Software Engineering Conference
ER -