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Third Asia-Pacific Software Engineering Conference (APSEC'96)
Analysis of Software Process Improvement Experience Using the Project Visibility Index
Seoul, SOUTH KOREA
December 04-December 07
ISBN: 0-8186-7638-8
ASCII Text
x 
 
K. Sakamoto, N. Niihara, T. Tanaka, K. Nakakoji, K. Kishida, "Analysis of Software Process Improvement Experience Using the Project Visibility Index," Asia-Pacific Software Engineering Conference, pp. 139, Third Asia-Pacific Software Engineering Conference (APSEC'96), 1996.
 
 
BibTex
x
 
@article{ 10.1109/APSEC.1996.566749,
author = {K. Sakamoto and N. Niihara and T. Tanaka and K. Nakakoji and K. Kishida},
title = {Analysis of Software Process Improvement Experience Using the Project Visibility Index},
journal ={Asia-Pacific Software Engineering Conference},
volume = {0},
year = {1996},
isbn = {0-8186-7638-8},
pages = {139},
doi = {http://doi.ieeecomputersociety.org/10.1109/APSEC.1996.566749},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Asia-Pacific Software Engineering Conference
TI - Analysis of Software Process Improvement Experience Using the Project Visibility Index
SN - 0-8186-7638-8
SP
EP
A1 - K. Sakamoto,
A1 - N. Niihara,
A1 - T. Tanaka,
A1 - K. Nakakoji,
A1 - K. Kishida,
PY - 1996
KW - human resource management; software process improvement; project visibility index; capability maturity model; OMRON; Japanese microprocessor manufacturer; project predictability; accuracy; variability; performance; qualitative analysis; quality; cost; timely delivery; review-effort ratios; productivity; project visibility
VL - 0
JA - Asia-Pacific Software Engineering Conference
ER -
 
K. Sakamoto, OMRON Corp., Shiga, Japan
N. Niihara, OMRON Corp., Shiga, Japan
T. Tanaka, OMRON Corp., Shiga, Japan
K. Nakakoji, OMRON Corp., Shiga, Japan
K. Kishida, OMRON Corp., Shiga, Japan
Based on the capability maturity model (CMM), process improvement at OMRON, a Japanese microprocessor manufacturer, increased project predictability in three ways: accuracy, variability, and performance. The authors use the project visibility index (PVI) and other measurements to quantitatively demonstrate this. Qualitative analysis of how and why OMRON achieved higher project visibility and increases in the QCD (quality, cost, and delivery on time) factors are supported with data on review-effort ratios and productivity. They identify factors directly affected by high project visibility.
Index Terms:
human resource management; software process improvement; project visibility index; capability maturity model; OMRON; Japanese microprocessor manufacturer; project predictability; accuracy; variability; performance; qualitative analysis; quality; cost; timely delivery; review-effort ratios; productivity; project visibility
Citation:
K. Sakamoto, N. Niihara, T. Tanaka, K. Nakakoji, K. Kishida, "Analysis of Software Process Improvement Experience Using the Project Visibility Index," apsec, pp.139, Third Asia-Pacific Software Engineering Conference (APSEC'96), 1996
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