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Second Asia-Pacific Conference on Quality Software (APAQS'01)
A Risk-Driven Design Model for Embedded System
Hong Kong
December 10-December 11
ISBN: 0-7695-1287-9
Y. Dong, Chinese Academy of Sciences
M. Li, Chinese Academy of Sciences
Embedded system is becoming a hot issue for a lot of appliances. However, the development of embedded systems faces the challenge of high risks from market pressures and lack of domain expertise. In this paper, we introduce a risk-driven model for embedded system developing. Driven by risk evaluation, the model guides the embedded system developing in a module-based approach. More- over, a risk evaluation framework composing of three-dimension metrics is provided with the model to address and track the development risk, including metrics for economy, personnel and technology. A case study is provide d to demonstrate how the model and framework are applied.
Citation:
Y. Dong, M. Li, "A Risk-Driven Design Model for Embedded System," apaqs, pp.0204, Second Asia-Pacific Conference on Quality Software (APAQS'01), 2001
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