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The First Asia-Pacific Conference on Quality Software (APAQS'00)
On the Completeness of Test Cases for Atomic Arithmetic Expressions
Hong Kong, China
October 30-October 31
ISBN: 0-7695-0825-1
T.H. Tse, University of Hong Kong
X. Feng, University of Hong Kong
T.Y. Chen, Swinburne University of Technology
Most research on weak mutation testing focuses on predicate statements. Relative little attention has been paid to arithmetic expressions. In this paper, we analyse the latter type of expression and prove that, given an atomic arithmetic expression, if it contains no variable or if the operator is the unary “++” or “--”, then a single test case is sufficient and necessary to kill any fundamental mutant; otherwise, two test cases are sufficient and necessary.
Index Terms:
Arithmetic expressions, completeness of test cases, mutation operators, mutation testing, software testing
Citation:
T.H. Tse, X. Feng, T.Y. Chen, "On the Completeness of Test Cases for Atomic Arithmetic Expressions," apaqs, pp.149, The First Asia-Pacific Conference on Quality Software (APAQS'00), 2000
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