2008 Second Asia International Conference on Modelling & Simulation Fast and Accurate Estimate SET Voltage Pulses from Transient Currents Induced by Heavy Ion May 13-May 15 ISBN: 978-0-7695-3136-6
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/AMS.2008.165
Soft error induced by SET (Single Event Transient) has been more and more substantial. Previously SET transient current has been careful measure and modeled. However the voltage pulse is more concerned in SET analyze and it is difficult to be measured directly. In this paper, we deduce the relationship between current pulse and voltage pulse and present a numerical technique to accurately estimate transient voltage pulses from measured transient current. The method is validated through device simulation. Experiment results show our method agrees with device simulation, while speed is much faster.
Index Terms:
SET, voltage pulse, radiation effect
Citation:
Liu Biwei, Chen Shuming, "Fast and Accurate Estimate SET Voltage Pulses from Transient Currents Induced by Heavy Ion," ams, pp.1021-1024, 2008 Second Asia International Conference on Modelling & Simulation, 2008 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||