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29th Applied Imagery Pattern Recognition Workshop (AIPR'00)
Development of Mammogram Computer-Aided Diagnosis Systems Using Optical Processing Technology
Washington, D.C.
October 16-October 18
ISBN: 0-7695-0978-9
Scott Lindell, Lockheed Martin Astronautics, Denver, Colorado
Gary Shapiro, Lockheed Martin Astronautics, Denver, Colorado
Kenneth Weil, MedDetect LLC, Denver, Colorado
David Flannery, MedDetect LLC, Denver, Colorado
Jeffrey Levy, MedDetect LLC, Denver, Colorado
Wei Qian, U. South Florida, Tampa, Florida
Mammogram computer-aided diagnosis (CAD) systems based on digital image processing algorithms are under development. These systems act as an aid to the radiologist, providing image cues of the locations of likely cancer lesions, and they have been shown to increase lesion detection performance. The use of state-of-the-art hybrid optical and digital processing technologies affords a reduction in processing time, and enables further improvements in sensitivity and specificity. Many CAD algorithm components can be mapped into linear filtering operations and implemented in a Fourier transform coherent optical processor. With the near-term promise of performing 512x512-sample convolutions at 1,000 frames-per-second rates, optical processors will greatly increase CAD system speed. A test-bed hybrid optical/electronic processor is under development following the successful completion of studies that verified the feasibility of mapping algorithms into optically-implemented filtering operations.
Citation:
Scott Lindell, Gary Shapiro, Kenneth Weil, David Flannery, Jeffrey Levy, Wei Qian, "Development of Mammogram Computer-Aided Diagnosis Systems Using Optical Processing Technology," aipr, pp.173, 29th Applied Imagery Pattern Recognition Workshop (AIPR'00), 2000
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