34th Applied Imagery and Pattern Recognition Workshop (AIPR'05) An Image Metric-Based ATR Performance Prediction Testbed Washington, DC October 19-October 21 ISBN: 0-7695-2479-6
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/AIPR.2005.15
Currently, automatic target recognition (ATR) evaluation techniques use simple models, such as quick-look models, or detailed exhaustive simulation. Simple models cannot accurately quantify performance, while the detailed simulation requires enumerating each operating condition. A need exists for ATR performance prediction based on more accurate models. We develop a predictor based on image measures quantifying the intrinsic ATR difficulty on an image. These measures include: CFAR, Power Spectrum Signature,Probability of edge etc. We propose a two-phase approach: a learning phase, where image measures are computed on set of test images, and the ATR performance measured; and a performance prediction phase. The learning phase produces a mapping, valid across various ATR algorithms, even applicable when no image truth is available (e.g., evaluation for denied area imagery. We present a performance predictor using a trained classifier ATR constructed using GENIE, a tool from Los Alamos.
Citation:
Scott K. Ralph, John Irvine, Magn? Snorrason, Mark R. Stevens, David Vanstone, "An Image Metric-Based ATR Performance Prediction Testbed," aipr, pp.192-197, 34th Applied Imagery and Pattern Recognition Workshop (AIPR'05), 2005 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||