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33rd Applied Imagery Pattern Recognition Workshop (AIPR'04)
Multiple-Aperture Imaging Spectrometer: Computer Simulation and Experimental Validation
Cosmos Club, Washington, DC
October 13-October 15
ISBN: 0-7695-2250-5
ASCII Text
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Rick Kendrick, Eric H. Smith, David N. Christie, David A. Bennett, David Theil, Eamon Barrett, "Multiple-Aperture Imaging Spectrometer: Computer Simulation and Experimental Validation," Applied Image Pattern Recognition Workshop,, pp. 3-9, 33rd Applied Imagery Pattern Recognition Workshop (AIPR'04), 2004.
 
 
BibTex
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@article{ 10.1109/AIPR.2004.32,
author = {Rick Kendrick and Eric H. Smith and David N. Christie and David A. Bennett and David Theil and Eamon Barrett},
title = {Multiple-Aperture Imaging Spectrometer: Computer Simulation and Experimental Validation},
journal ={Applied Image Pattern Recognition Workshop,},
volume = {0},
year = {2004},
issn = {1550-5219},
pages = {3-9},
doi = {http://doi.ieeecomputersociety.org/10.1109/AIPR.2004.32},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Applied Image Pattern Recognition Workshop,
TI - Multiple-Aperture Imaging Spectrometer: Computer Simulation and Experimental Validation
SN - 1550-5219
SP3
EP9
A1 - Rick Kendrick,
A1 - Eric H. Smith,
A1 - David N. Christie,
A1 - David A. Bennett,
A1 - David Theil,
A1 - Eamon Barrett,
PY - 2004
KW - null
VL - 0
JA - Applied Image Pattern Recognition Workshop,
ER -
 
Rick Kendrick, Lockheed Martin Space Systems Company, Sunnyvale, California
Eric H. Smith, Lockheed Martin Space Systems Company, Sunnyvale, California
David N. Christie, Lockheed Martin Space Systems Company, Sunnyvale, California
David A. Bennett, Lockheed Martin Space Systems Company, Sunnyvale, California
David Theil, Lockheed Martin Space Systems Company, Sunnyvale, California
Eamon Barrett, Lockheed Martin Space Systems Company, Sunnyvale, California
The Lockheed Martin Advanced Technology Center (LM/ATC) is actively investigating alternate applications of coherently phased sparse-aperture optical imaging arrays. Controlling the relative phasing of the apertures enables these arrays to function as imaging interferometers, providing high spectral resolution as well as high spatial resolution imagery. In this paper we will: a) summarize the basic theory of multiple-aperture imaging interferometers; b) illustrate the theory with Fourier transform Imaging Spectrometer (FTIS) simulations, using the Rochester Institute of Technology hyper-spectral scene simulator (DIRSIG) as our source of simulated input data; c) validate the theory with experimental results derived with an LM/ATC optical FTIS tested.
Citation:
Rick Kendrick, Eric H. Smith, David N. Christie, David A. Bennett, David Theil, Eamon Barrett, "Multiple-Aperture Imaging Spectrometer: Computer Simulation and Experimental Validation," aipr, pp.3-9, 33rd Applied Imagery Pattern Recognition Workshop (AIPR'04), 2004
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