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33rd Applied Imagery Pattern Recognition Workshop (AIPR'04)
Monitoring and Reporting of Fingerprint Image Quality and Match Accuracy for a Large User Application
Cosmos Club, Washington, DC
October 13-October 15
ISBN: 0-7695-2250-5
ASCII Text
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Teddy Ko, Rama Krishnan, "Monitoring and Reporting of Fingerprint Image Quality and Match Accuracy for a Large User Application," Applied Image Pattern Recognition Workshop,, pp. 159-164, 33rd Applied Imagery Pattern Recognition Workshop (AIPR'04), 2004.
 
 
BibTex
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@article{ 10.1109/AIPR.2004.30,
author = {Teddy Ko and Rama Krishnan},
title = {Monitoring and Reporting of Fingerprint Image Quality and Match Accuracy for a Large User Application},
journal ={Applied Image Pattern Recognition Workshop,},
volume = {0},
year = {2004},
issn = {1550-5219},
pages = {159-164},
doi = {http://doi.ieeecomputersociety.org/10.1109/AIPR.2004.30},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - Applied Image Pattern Recognition Workshop,
TI - Monitoring and Reporting of Fingerprint Image Quality and Match Accuracy for a Large User Application
SN - 1550-5219
SP159
EP164
A1 - Teddy Ko,
A1 - Rama Krishnan,
PY - 2004
KW - null
VL - 0
JA - Applied Image Pattern Recognition Workshop,
ER -
 
Teddy Ko, Lockheed Martin, Washington, DC
Rama Krishnan, Lockheed Martin, Washington, DC
The main objective of this paper is to present the methodology used for measuring and monitoring the quality of fingerprint database and fingerprint match performance of a large user fingerprint identification system. The Department of Homeland Security's (DHS) Biometric Identification System is used as an example for this study. In addition the paper will present lessons learned during system performance testing and independent validation & verification analysis of large scale systems such as DHS's Biometric System and recommend improvements for the current test methodology.
Citation:
Teddy Ko, Rama Krishnan, "Monitoring and Reporting of Fingerprint Image Quality and Match Accuracy for a Large User Application," aipr, pp.159-164, 33rd Applied Imagery Pattern Recognition Workshop (AIPR'04), 2004
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