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32nd Applied Imagery Pattern Recognition Workshop (AIPR'03)
Defect Detection on Patterned Jacquard Fabric
Washington, DC
October 15-October 17
ISBN: 0-7695-2029-4
ASCII Text
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Henry Y. T. Ngan, Grantham K. H. Pang, S. P. Yung, Michael K. Ng, "Defect Detection on Patterned Jacquard Fabric," Applied Image Pattern Recognition Workshop,, pp. 163, 32nd Applied Imagery Pattern Recognition Workshop (AIPR'03), 2003.
 
 
BibTex
x
 
@article{ 10.1109/AIPR.2003.1284266,
author = {Henry Y. T. Ngan and Grantham K. H. Pang and S. P. Yung and Michael K. Ng},
title = {Defect Detection on Patterned Jacquard Fabric},
journal ={Applied Image Pattern Recognition Workshop,},
volume = {0},
year = {2003},
isbn = {0-7695-2029-4},
pages = {163},
doi = {http://doi.ieeecomputersociety.org/10.1109/AIPR.2003.1284266},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Applied Image Pattern Recognition Workshop,
TI - Defect Detection on Patterned Jacquard Fabric
SN - 0-7695-2029-4
SP
EP
A1 - Henry Y. T. Ngan,
A1 - Grantham K. H. Pang,
A1 - S. P. Yung,
A1 - Michael K. Ng,
PY - 2003
KW - null
VL - 0
JA - Applied Image Pattern Recognition Workshop,
ER -
 
Henry Y. T. Ngan, The University of Hong Kong, Pokfulam Road
Grantham K. H. Pang, The University of Hong Kong, Pokfulam Road
S. P. Yung, The University of Hong Kong, Pokfulam Road
Michael K. Ng, The University of Hong Kong, Pokfulam Road
The techniques for defect detection on plain (unpatterned) fabrics have been well developed nowadays. This paper is on developing visual inspection methods for defect detection on patterned fabrics. A review on some defect detection methods on patterned fabrics will be given. Then, a new method for patterned fabric inspection called Golden Image Subtraction (GIS) is introduced. GIS is an efficient and fast method, which can segment out the defective regions on patterned fabric effectively. An improved version of the GIS method using wavelet transform is also given. This research result will contribute to the development of an automated fabric inspection machine for the textile industry.
Citation:
Henry Y. T. Ngan, Grantham K. H. Pang, S. P. Yung, Michael K. Ng, "Defect Detection on Patterned Jacquard Fabric," aipr, pp.163, 32nd Applied Imagery Pattern Recognition Workshop (AIPR'03), 2003
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