Second NASA/ESA Conference on Adaptive Hardware and Systems (AHS 2007) Evolving Redundant Structures for Reliable Circuits - Lessons Learned University of Edinburgh, Scotland, United Kingdom August 05-August 08 ISBN: 0-7695-2866-X
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/AHS.2007.52
Fault Tolerance is an increasing challenge for integrated circuits due to semiconductor technology scaling. This paper looks at how artificial evolution may be tuned to the creation of novel redundancy structures which may be applied to meet this challenge. However, as these structures are unknown it is a challenge in itself to tune evolution to create them. As such, no solution has yet been found. This paper provides a discussion about the issues addressed and experiments conducted and thus provides an overview of the lessons learned in this work.
Citation:
Asbjoern Djupdal, Pauline C. Haddow, "Evolving Redundant Structures for Reliable Circuits - Lessons Learned," ahs, pp.455-462, Second NASA/ESA Conference on Adaptive Hardware and Systems (AHS 2007), 2007 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||