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OOF: An Image-Based Finite-Element Analysis of Material Microstructures
May/June 2001 (vol. 3 no. 3)
pp. 15-23
ASCII Text
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Stephen A. Langer, Edwin R. Fuller, W. Craig Carter, "OOF: An Image-Based Finite-Element Analysis of Material Microstructures," Computing in Science and Engineering, vol. 3, no. 3, pp. 15-23, May/June, 2001.
 
 
BibTex
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@article{ 10.1109/5992.919261,
author = {Stephen A. Langer and Edwin R. Fuller and W. Craig Carter},
title = {OOF: An Image-Based Finite-Element Analysis of Material Microstructures},
journal ={Computing in Science and Engineering},
volume = {3},
number = {3},
issn = {1521-9615},
year = {2001},
pages = {15-23},
doi = {http://doi.ieeecomputersociety.org/10.1109/5992.919261},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - Computing in Science and Engineering
TI - OOF: An Image-Based Finite-Element Analysis of Material Microstructures
IS - 3
SN - 1521-9615
SP15
EP23
EPD - 15-23
A1 - Stephen A. Langer,
A1 - Edwin R. Fuller,
A1 - W. Craig Carter,
PY - 2001
VL - 3
JA - Computing in Science and Engineering
ER -
 
Determining a material's macroscopic properties given its microscopic structure is of fundamental importance to materials science. The authors describe two public-domain programs that jointly predict macroscopic behavior. The programs start from an image of the microstructure and end with results from finite-element calculations.
Citation:
Stephen A. Langer, Edwin R. Fuller, W. Craig Carter, "OOF: An Image-Based Finite-Element Analysis of Material Microstructures," Computing in Science and Engineering, vol. 3, no. 3, pp. 15-23, May/June 2001, doi:10.1109/5992.919261
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