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Characterizing Substrate Coupling in Deep-Submicron Designs
March/April 2002 (vol. 19 no. 2)
pp. 4-15
ASCII Text
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Luis Miguel Silveira, Nuno Vargas, "Characterizing Substrate Coupling in Deep-Submicron Designs," IEEE Design and Test of Computers, vol. 19, no. 2, pp. 4-15, March/April, 2002.
 
 
BibTex
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@article{ 10.1109/54.990437,
author = {Luis Miguel Silveira and Nuno Vargas},
title = {Characterizing Substrate Coupling in Deep-Submicron Designs},
journal ={IEEE Design and Test of Computers},
volume = {19},
number = {2},
issn = {0740-7475},
year = {2002},
pages = {4-15},
doi = {http://doi.ieeecomputersociety.org/10.1109/54.990437},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - Characterizing Substrate Coupling in Deep-Submicron Designs
IS - 2
SN - 0740-7475
SP4
EP15
EPD - 4-15
A1 - Luis Miguel Silveira,
A1 - Nuno Vargas,
PY - 2002
VL - 19
JA - IEEE Design and Test of Computers
ER -
 

The accurate modeling of noise-coupling effects caused by crosstalk through the substrate is an increasingly important concern for design and verification of analog, digital, and mixed systems. With the technique described here, designers can efficiently extract accurate substrate-coupling parameters from deep-submicron designs.

Citation:
Luis Miguel Silveira, Nuno Vargas, "Characterizing Substrate Coupling in Deep-Submicron Designs," IEEE Design and Test of Computers, vol. 19, no. 2, pp. 4-15, Mar./Apr. 2002, doi:10.1109/54.990437
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