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Analyzing and Diagnosing Interconnect Faults in Bus-Structured Systems
January/February 2002 (vol. 19 no. 1)
pp. 54-64
ASCII Text
x 
 
Jun Zhao, Fred J. Meyer, Fabrizio Lombardi, "Analyzing and Diagnosing Interconnect Faults in Bus-Structured Systems," IEEE Design and Test of Computers, vol. 19, no. 1, pp. 54-64, January/February, 2002.
 
 
BibTex
x
 
@article{ 10.1109/54.980053,
author = {Jun Zhao and Fred J. Meyer and Fabrizio Lombardi},
title = {Analyzing and Diagnosing Interconnect Faults in Bus-Structured Systems},
journal ={IEEE Design and Test of Computers},
volume = {19},
number = {1},
issn = {0740-7475},
year = {2002},
pages = {54-64},
doi = {http://doi.ieeecomputersociety.org/10.1109/54.980053},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - Analyzing and Diagnosing Interconnect Faults in Bus-Structured Systems
IS - 1
SN - 0740-7475
SP54
EP64
EPD - 54-64
A1 - Jun Zhao,
A1 - Fred J. Meyer,
A1 - Fabrizio Lombardi,
PY - 2002
VL - 19
JA - IEEE Design and Test of Computers
ER -
 

Testing multimodule systems presents several challenges, particularly when systems use submicron technology. The authors propose strategies to diagnose interconnect faults in bus-structured systems using several models.

Citation:
Jun Zhao, Fred J. Meyer, Fabrizio Lombardi, "Analyzing and Diagnosing Interconnect Faults in Bus-Structured Systems," IEEE Design and Test of Computers, vol. 19, no. 1, pp. 54-64, Jan./Feb. 2002, doi:10.1109/54.980053
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