High-Accuracy Flush-and-Scan Software Diagnostic

Design&Test
2001
Issue No. 6 - November/December
Abstract - High-Accuracy Flush-and-Scan Software Diagnostic

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November/December 2001 (vol. 18 no. 6)

pp. 56-62

	ASCII Text	x
	Kevin Stanley, "High-Accuracy Flush-and-Scan Software Diagnostic," IEEE Design and Test of Computers, vol. 18, no. 6, pp. 56-62, November/December, 2001.

	BibTex	x
	@article{ 10.1109/54.970425, author = {Kevin Stanley}, title = {High-Accuracy Flush-and-Scan Software Diagnostic}, journal ={IEEE Design and Test of Computers}, volume = {18}, number = {6}, issn = {0740-7475}, year = {2001}, pages = {56-62}, doi = {http://doi.ieeecomputersociety.org/10.1109/54.970425}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - IEEE Design and Test of Computers TI - High-Accuracy Flush-and-Scan Software Diagnostic IS - 6 SN - 0740-7475 SP56 EP62 EPD - 56-62 A1 - Kevin Stanley, PY - 2001 VL - 18 JA - IEEE Design and Test of Computers ER -

Kevin Stanley

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.970425

This software technique operates over a wide range of defect modes to quickly and accurately diagnose the failing latch in a defective chain without special circuitry or pattern generation.

Citation:

Kevin Stanley, "High-Accuracy Flush-and-Scan Software Diagnostic," IEEE Design and Test of Computers, vol. 18, no. 6, pp. 56-62, Nov./Dec. 2001, doi:10.1109/54.970425

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