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Test Resource Partitioning for SOCs
September/October 2001 (vol. 18 no. 5)
pp. 80-91
ASCII Text
x 
 
Anshuman Chandra, Krishnendu Chakrabarty, "Test Resource Partitioning for SOCs," IEEE Design and Test of Computers, vol. 18, no. 5, pp. 80-91, September/October, 2001.
 
 
BibTex
x
 
@article{ 10.1109/54.953275,
author = {Anshuman Chandra and Krishnendu Chakrabarty},
title = {Test Resource Partitioning for SOCs},
journal ={IEEE Design and Test of Computers},
volume = {18},
number = {5},
issn = {0740-7475},
year = {2001},
pages = {80-91},
doi = {http://doi.ieeecomputersociety.org/10.1109/54.953275},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - Test Resource Partitioning for SOCs
IS - 5
SN - 0740-7475
SP80
EP91
EPD - 80-91
A1 - Anshuman Chandra,
A1 - Krishnendu Chakrabarty,
PY - 2001
VL - 18
JA - IEEE Design and Test of Computers
ER -
 

A new test-resource-partitioning approach, based on test data compression and on-chip decompression, reduces data volume, decreases testing time, and accommodates slower (less expensive) testers without decreasing test quality.

Citation:
Anshuman Chandra, Krishnendu Chakrabarty, "Test Resource Partitioning for SOCs," IEEE Design and Test of Computers, vol. 18, no. 5, pp. 80-91, Sep./Oct. 2001, doi:10.1109/54.953275
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