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Economics of Built-in Self-Test
September/October 2001 (vol. 18 no. 5)
pp. 70-79
ASCII Text
x 
 
Louis Y. Ungar, Tony Ambler, "Economics of Built-in Self-Test," IEEE Design and Test of Computers, vol. 18, no. 5, pp. 70-79, September/October, 2001.
 
 
BibTex
x
 
@article{ 10.1109/54.953274,
author = {Louis Y. Ungar and Tony Ambler},
title = {Economics of Built-in Self-Test},
journal ={IEEE Design and Test of Computers},
volume = {18},
number = {5},
issn = {0740-7475},
year = {2001},
pages = {70-79},
doi = {http://doi.ieeecomputersociety.org/10.1109/54.953274},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - Economics of Built-in Self-Test
IS - 5
SN - 0740-7475
SP70
EP79
EPD - 70-79
A1 - Louis Y. Ungar,
A1 - Tony Ambler,
PY - 2001
VL - 18
JA - IEEE Design and Test of Computers
ER -
 

Using built-in self-test at the right level offers users significant cost savings, but determining which level, if any, is best for BIST can be complex. A detailed economic analysis can unravel heterogeneous costs and benefits so that designers and managers can make the right decision.

Citation:
Louis Y. Ungar, Tony Ambler, "Economics of Built-in Self-Test," IEEE Design and Test of Computers, vol. 18, no. 5, pp. 70-79, Sep./Oct. 2001, doi:10.1109/54.953274
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