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Embedded DRAM Development: Technology, Physical Design, and Application Issues
May/June 2001 (vol. 18 no. 3)
pp. 7-15
ASCII Text
x 
 
Doris Keitel-Schulz, Norbert Wehn, "Embedded DRAM Development: Technology, Physical Design, and Application Issues," IEEE Design and Test of Computers, vol. 18, no. 3, pp. 7-15, May/June, 2001.
 
 
BibTex
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@article{ 10.1109/54.922799,
author = {Doris Keitel-Schulz and Norbert Wehn},
title = {Embedded DRAM Development: Technology, Physical Design, and Application Issues},
journal ={IEEE Design and Test of Computers},
volume = {18},
number = {3},
issn = {0740-7475},
year = {2001},
pages = {7-15},
doi = {http://doi.ieeecomputersociety.org/10.1109/54.922799},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - Embedded DRAM Development: Technology, Physical Design, and Application Issues
IS - 3
SN - 0740-7475
SP7
EP15
EPD - 7-15
A1 - Doris Keitel-Schulz,
A1 - Norbert Wehn,
PY - 2001
VL - 18
JA - IEEE Design and Test of Computers
ER -
 
Embedded DRAM provides advantages from a system point of view, along with many technical challenges. This article presents an overview of circuit, technology, and physical design methodology issues in embedded DRAM development and application.
Citation:
Doris Keitel-Schulz, Norbert Wehn, "Embedded DRAM Development: Technology, Physical Design, and Application Issues," IEEE Design and Test of Computers, vol. 18, no. 3, pp. 7-15, May/June 2001, doi:10.1109/54.922799
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