IC Diagnosis Using Multiple Supply Pad IDDQs

Design&Test
2001
Issue No. 1 - January/February
Abstract - IC Diagnosis Using Multiple Supply Pad IDDQs

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January/February 2001 (vol. 18 no. 1)

pp. 50-61

	ASCII Text	x
	Jim Plusquellic, "IC Diagnosis Using Multiple Supply Pad IDDQs," IEEE Design and Test of Computers, vol. 18, no. 1, pp. 50-61, January/February, 2001.

	BibTex	x
	@article{ 10.1109/54.902822, author = {Jim Plusquellic}, title = {IC Diagnosis Using Multiple Supply Pad IDDQs}, journal ={IEEE Design and Test of Computers}, volume = {18}, number = {1}, issn = {0740-7475}, year = {2001}, pages = {50-61}, doi = {http://doi.ieeecomputersociety.org/10.1109/54.902822}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - IEEE Design and Test of Computers TI - IC Diagnosis Using Multiple Supply Pad IDDQs IS - 1 SN - 0740-7475 SP50 EP61 EPD - 50-61 A1 - Jim Plusquellic, PY - 2001 VL - 18 JA - IEEE Design and Test of Computers ER -

Jim Plusquellic

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.902822

A IDDQ technique is proposed based on an extension of a VDDT-based method called transient signal analysis. The method, called quiescent signal analysis, uses IDDQs measured at multiple supply pins as a means of localizing defects.

Citation:

Jim Plusquellic, "IC Diagnosis Using Multiple Supply Pad IDDQs," IEEE Design and Test of Computers, vol. 18, no. 1, pp. 50-61, Jan./Feb. 2001, doi:10.1109/54.902822

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