Jennifer Dworak, Jason D. Wicker, Sooryong Lee, Michael R. Grimaila, M. Ray Mercer, Kenneth M. Butler, Bret Stewart, Li-C. Wang, "Defect-Oriented Testing and Defective-Part-Level Prediction," IEEE Design and Test of Computers, vol. 18, no. 1, pp. 31-41, January/February, 2001.

@article{ 10.1109/54.902820,
author = {Jennifer Dworak and Jason D. Wicker and Sooryong Lee and Michael R. Grimaila and M. Ray Mercer and Kenneth M. Butler and Bret Stewart and Li-C. Wang},
title = {Defect-Oriented Testing and Defective-Part-Level Prediction},
journal ={IEEE Design and Test of Computers},
volume = {18},
number = {1},
issn = {0740-7475},
year = {2001},
pages = {31-41},
doi = {http://doi.ieeecomputersociety.org/10.1109/54.902820},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}

TY - MGZN
JO - IEEE Design and Test of Computers
TI - Defect-Oriented Testing and Defective-Part-Level Prediction
IS - 1
SN - 0740-7475
SP31
EP41
EPD - 31-41
A1 - Jennifer Dworak,
A1 - Jason D. Wicker,
A1 - Sooryong Lee,
A1 - Michael R. Grimaila,
A1 - M. Ray Mercer,
A1 - Kenneth M. Butler,
A1 - Bret Stewart,
A1 - Li-C. Wang,
PY - 2001
VL - 18
JA - IEEE Design and Test of Computers
ER -