loading...
 This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
A Reliability Testing Environment for Off-the-Shelf Memory Subsystems
July-September 2000 (vol. 17 no. 3)
pp. 116-124
ASCII Text
x 
 
Seung H. Hwang, Gwan S. Choi, "A Reliability Testing Environment for Off-the-Shelf Memory Subsystems," IEEE Design and Test of Computers, vol. 17, no. 3, pp. 116-124, July-September, 2000.
 
 
BibTex
x
 
@article{ 10.1109/54.867902,
author = {Seung H. Hwang and Gwan S. Choi},
title = {A Reliability Testing Environment for Off-the-Shelf Memory Subsystems},
journal ={IEEE Design and Test of Computers},
volume = {17},
number = {3},
issn = {0740-7475},
year = {2000},
pages = {116-124},
doi = {http://doi.ieeecomputersociety.org/10.1109/54.867902},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - A Reliability Testing Environment for Off-the-Shelf Memory Subsystems
IS - 3
SN - 0740-7475
SP116
EP124
EPD - 116-124
A1 - Seung H. Hwang,
A1 - Gwan S. Choi,
PY - 2000
VL - 17
JA - IEEE Design and Test of Computers
ER -
 

A cyclotron-based radiation test environment enables engineers to characterize the soft-error sensitivity of memory subsystems and assess its impact at the system level. Device/circuit modeling and simulation assist the radiation experiments in detecting device-level single-event upsets.

Citation:
Seung H. Hwang, Gwan S. Choi, "A Reliability Testing Environment for Off-the-Shelf Memory Subsystems," IEEE Design and Test of Computers, vol. 17, no. 3, pp. 116-124, July-Sept. 2000, doi:10.1109/54.867902
Usage of this product signifies your acceptance of the Terms of Use.