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First Results of ITC'99 Benchmark Circuits
July-September 2000 (vol. 17 no. 3)
pp. 54-59
ASCII Text
x 
 
Luis Basto, "First Results of ITC'99 Benchmark Circuits," IEEE Design and Test of Computers, vol. 17, no. 3, pp. 54-59, July-September, 2000.
 
 
BibTex
x
 
@article{ 10.1109/54.867895,
author = {Luis Basto},
title = {First Results of ITC'99 Benchmark Circuits},
journal ={IEEE Design and Test of Computers},
volume = {17},
number = {3},
issn = {0740-7475},
year = {2000},
pages = {54-59},
doi = {http://doi.ieeecomputersociety.org/10.1109/54.867895},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - First Results of ITC'99 Benchmark Circuits
IS - 3
SN - 0740-7475
SP54
EP59
EPD - 54-59
A1 - Luis Basto,
PY - 2000
VL - 17
JA - IEEE Design and Test of Computers
ER -
 

The ISCAS circuits have long been used as design-for-testability benchmarks; however, recent progress in technology requires newer DFT standards. This look at the ITC'99 benchmarks reveals complexities that will serve as a starting point for other researchers.

Citation:
Luis Basto, "First Results of ITC'99 Benchmark Circuits," IEEE Design and Test of Computers, vol. 17, no. 3, pp. 54-59, July-Sept. 2000, doi:10.1109/54.867895
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