First Results of ITC'99 Benchmark Circuits

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July-September 2000 (vol. 17 no. 3)

pp. 54-59

	ASCII Text	x
	Luis Basto, "First Results of ITC'99 Benchmark Circuits," IEEE Design and Test of Computers, vol. 17, no. 3, pp. 54-59, July-September, 2000.

	BibTex	x
	@article{ 10.1109/54.867895, author = {Luis Basto}, title = {First Results of ITC'99 Benchmark Circuits}, journal ={IEEE Design and Test of Computers}, volume = {17}, number = {3}, issn = {0740-7475}, year = {2000}, pages = {54-59}, doi = {http://doi.ieeecomputersociety.org/10.1109/54.867895}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - IEEE Design and Test of Computers TI - First Results of ITC'99 Benchmark Circuits IS - 3 SN - 0740-7475 SP54 EP59 EPD - 54-59 A1 - Luis Basto, PY - 2000 VL - 17 JA - IEEE Design and Test of Computers ER -

Luis Basto

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.867895

The ISCAS circuits have long been used as design-for-testability benchmarks; however, recent progress in technology requires newer DFT standards. This look at the ITC'99 benchmarks reveals complexities that will serve as a starting point for other researchers.

Citation:

Luis Basto, "First Results of ITC'99 Benchmark Circuits," IEEE Design and Test of Computers, vol. 17, no. 3, pp. 54-59, July-Sept. 2000, doi:10.1109/54.867895

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