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Inserting Scan at the Behavioral Level
July-September 2000 (vol. 17 no. 3)
pp. 34-42
ASCII Text
x 
 
Chouki Aktouf, Hérvé Fleury, Chantal Robach, "Inserting Scan at the Behavioral Level," IEEE Design and Test of Computers, vol. 17, no. 3, pp. 34-42, July-September, 2000.
 
 
BibTex
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@article{ 10.1109/54.867892,
author = {Chouki Aktouf and Hérvé Fleury and Chantal Robach},
title = {Inserting Scan at the Behavioral Level},
journal ={IEEE Design and Test of Computers},
volume = {17},
number = {3},
issn = {0740-7475},
year = {2000},
pages = {34-42},
doi = {http://doi.ieeecomputersociety.org/10.1109/54.867892},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - Inserting Scan at the Behavioral Level
IS - 3
SN - 0740-7475
SP34
EP42
EPD - 34-42
A1 - Chouki Aktouf,
A1 - Hérvé Fleury,
A1 - Chantal Robach,
PY - 2000
VL - 17
JA - IEEE Design and Test of Computers
ER -
 

This article presents a method for inserting test logic at the behavioral level of a VHDL design description. The method is easy to use, and in most cases it requires lower area overhead than classical scan insertion methods.

Citation:
Chouki Aktouf, Hérvé Fleury, Chantal Robach, "Inserting Scan at the Behavioral Level," IEEE Design and Test of Computers, vol. 17, no. 3, pp. 34-42, July-Sept. 2000, doi:10.1109/54.867892
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