Chouki Aktouf, Hérvé Fleury, Chantal Robach,
"Inserting Scan at the Behavioral Level,"
IEEE Design and Test of Computers, vol. 17, no. 3, pp. 34-42, July-September, 2000.
BibTex
x
@article{
10.1109/54.867892, author = {Chouki Aktouf and Hérvé Fleury and Chantal Robach}, title = {Inserting Scan at the Behavioral Level}, journal ={IEEE Design and Test of Computers}, volume = {17}, number = {3}, issn = {0740-7475}, year = {2000}, pages = {34-42}, doi = {http://doi.ieeecomputersociety.org/10.1109/54.867892}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
x
TY - MGZN JO - IEEE Design and Test of Computers TI - Inserting Scan at the Behavioral Level IS - 3 SN - 0740-7475 SP34 EP42 EPD - 34-42 A1 - Chouki Aktouf, A1 - Hérvé Fleury, A1 - Chantal Robach, PY - 2000 VL - 17 JA - IEEE Design and Test of Computers ER -
This article presents a method for inserting test logic at the behavioral level of a VHDL design description. The method is easy to use, and in most cases it requires lower area overhead than classical scan insertion methods.
Citation:
Chouki Aktouf, Hérvé Fleury, Chantal Robach, "Inserting Scan at the Behavioral Level," IEEE Design and Test of Computers, vol. 17, no. 3, pp. 34-42, July-Sept. 2000, doi:10.1109/54.867892
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