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The Mutating Metric for Benchmarking Test
July-September 2000 (vol. 17 no. 3)
pp. 18-21
ASCII Text
x 
 
Rohit Kapur, Cy Hay, T.w. Williams, "The Mutating Metric for Benchmarking Test," IEEE Design and Test of Computers, vol. 17, no. 3, pp. 18-21, July-September, 2000.
 
 
BibTex
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@article{ 10.1109/54.867890,
author = {Rohit Kapur and Cy Hay and T.w. Williams},
title = {The Mutating Metric for Benchmarking Test},
journal ={IEEE Design and Test of Computers},
volume = {17},
number = {3},
issn = {0740-7475},
year = {2000},
pages = {18-21},
doi = {http://doi.ieeecomputersociety.org/10.1109/54.867890},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - The Mutating Metric for Benchmarking Test
IS - 3
SN - 0740-7475
SP18
EP21
EPD - 18-21
A1 - Rohit Kapur,
A1 - Cy Hay,
A1 - T.w. Williams,
PY - 2000
VL - 17
JA - IEEE Design and Test of Computers
ER -
 

The monitoring of three ATPG tool parameters—fault coverage, test generation time, and test vector count—has improved test benchmarking over the years. Changing test dynamics, however, requires a different test metric.

Citation:
Rohit Kapur, Cy Hay, T.w. Williams, "The Mutating Metric for Benchmarking Test," IEEE Design and Test of Computers, vol. 17, no. 3, pp. 18-21, July-Sept. 2000, doi:10.1109/54.867890
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