Michael Eisenring, Lothar Thiele, Eckart Zitzler,
"Conflicting Criteria in Embedded System Design,"
IEEE Design and Test of Computers, vol. 17, no. 2, pp. 51-59, April-June, 2000.
BibTex
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@article{
10.1109/54.844334, author = {Michael Eisenring and Lothar Thiele and Eckart Zitzler}, title = {Conflicting Criteria in Embedded System Design}, journal ={IEEE Design and Test of Computers}, volume = {17}, number = {2}, issn = {0740-7475}, year = {2000}, pages = {51-59}, doi = {http://doi.ieeecomputersociety.org/10.1109/54.844334}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
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TY - MGZN JO - IEEE Design and Test of Computers TI - Conflicting Criteria in Embedded System Design IS - 2 SN - 0740-7475 SP51 EP59 EPD - 51-59 A1 - Michael Eisenring, A1 - Lothar Thiele, A1 - Eckart Zitzler, PY - 2000 VL - 17 JA - IEEE Design and Test of Computers ER -
This article presents a methodology to cope with the simultaneous optimization of multiple competing objectives and the different sources of heterogeneity in embedded system design.
Citation:
Michael Eisenring, Lothar Thiele, Eckart Zitzler, "Conflicting Criteria in Embedded System Design," IEEE Design and Test of Computers, vol. 17, no. 2, pp. 51-59, Apr.-June 2000, doi:10.1109/54.844334
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