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Conflicting Criteria in Embedded System Design
April-June 2000 (vol. 17 no. 2)
pp. 51-59
ASCII Text
x 
 
Michael Eisenring, Lothar Thiele, Eckart Zitzler, "Conflicting Criteria in Embedded System Design," IEEE Design and Test of Computers, vol. 17, no. 2, pp. 51-59, April-June, 2000.
 
 
BibTex
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@article{ 10.1109/54.844334,
author = {Michael Eisenring and Lothar Thiele and Eckart Zitzler},
title = {Conflicting Criteria in Embedded System Design},
journal ={IEEE Design and Test of Computers},
volume = {17},
number = {2},
issn = {0740-7475},
year = {2000},
pages = {51-59},
doi = {http://doi.ieeecomputersociety.org/10.1109/54.844334},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - Conflicting Criteria in Embedded System Design
IS - 2
SN - 0740-7475
SP51
EP59
EPD - 51-59
A1 - Michael Eisenring,
A1 - Lothar Thiele,
A1 - Eckart Zitzler,
PY - 2000
VL - 17
JA - IEEE Design and Test of Computers
ER -
 

This article presents a methodology to cope with the simultaneous optimization of multiple competing objectives and the different sources of heterogeneity in embedded system design.

Citation:
Michael Eisenring, Lothar Thiele, Eckart Zitzler, "Conflicting Criteria in Embedded System Design," IEEE Design and Test of Computers, vol. 17, no. 2, pp. 51-59, Apr.-June 2000, doi:10.1109/54.844334
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