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Design for Test and Time to Market: A Personal Perspective
July-September 1999 (vol. 16 no. 3)
pp. 23-27
ASCII Text
x 
 
Jon Turino, "Design for Test and Time to Market: A Personal Perspective," IEEE Design and Test of Computers, vol. 16, no. 3, pp. 23-27, July-September, 1999.
 
 
BibTex
x
 
@article{ 10.1109/54.785824,
author = {Jon Turino},
title = {Design for Test and Time to Market: A Personal Perspective},
journal ={IEEE Design and Test of Computers},
volume = {16},
number = {3},
issn = {0740-7475},
year = {1999},
pages = {23-27},
doi = {http://doi.ieeecomputersociety.org/10.1109/54.785824},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - Design for Test and Time to Market: A Personal Perspective
IS - 3
SN - 0740-7475
SP23
EP27
EPD - 23-27
A1 - Jon Turino,
PY - 1999
VL - 16
JA - IEEE Design and Test of Computers
ER -
 
This article explores current and future design for test implementation alternatives, including their impact on various product performance, yield, and test development time characteristics. It also discusses the relationship between electronic design for test automation and its effects on overall time to market for application-specific and system-on-chip (SoC) integrated circuits (ICs).
Citation:
Jon Turino, "Design for Test and Time to Market: A Personal Perspective," IEEE Design and Test of Computers, vol. 16, no. 3, pp. 23-27, July-Sept. 1999, doi:10.1109/54.785824
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