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The Third Millennium's Test Dilemma
October-December 1998 (vol. 15 no. 4)
pp. 7-11
ASCII Text
x 
 
Bill Bottoms, "The Third Millennium's Test Dilemma," IEEE Design and Test of Computers, vol. 15, no. 4, pp. 7-11, October-December, 1998.
 
 
BibTex
x
 
@article{ 10.1109/54.735921,
author = {Bill Bottoms},
title = {The Third Millennium's Test Dilemma},
journal ={IEEE Design and Test of Computers},
volume = {15},
number = {4},
issn = {0740-7475},
year = {1998},
pages = {7-11},
doi = {http://doi.ieeecomputersociety.org/10.1109/54.735921},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - The Third Millennium's Test Dilemma
IS - 4
SN - 0740-7475
SP7
EP11
EPD - 7-11
A1 - Bill Bottoms,
PY - 1998
VL - 15
JA - IEEE Design and Test of Computers
ER -
 

The president and CEO of Credence Systems, Bill Bottoms, addressed the VLSI Test Symposium held last April in Monterey, California. His keynote covered some of the challenges test engineers must face in the future. Specifically, Bottoms focused on what's driving the increase in test cost and what the industry can do about it.

Citation:
Bill Bottoms, "The Third Millennium's Test Dilemma," IEEE Design and Test of Computers, vol. 15, no. 4, pp. 7-11, Oct.-Dec. 1998, doi:10.1109/54.735921
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